SRMS 2010 | Structure of Metals, Semi- conductors and Alloys

Session 5

Synchrotron X-ray Microtomography, Modelling and Electron Microscopy Characterization of Thermally Induced Grain Refinement
Jiawei Mi, University of Oxford

Emerging materials - salient properties of the terahertz meta-foil
H. O. Moser, Singapore

Investigation of minute strain in SOI and strained Si/Si/Ge/Si semiconductor materials using a synchrotron radiation micro beam
Junji Matsui, Hyogo, Japan

High Resolution Synchrotron X-ray Diffraction Studies of Size and Strain Effects in a Complex Al-Fe-Cr-Ti Alloy (I11)
Simon Hogg, Loughborough University