SRMS 2010 | Coherence and Imaging

Session 8

Development of Coherent X-ray Diffraction Microscopy and Its Application in Materials Science
Yukio Takahashi, Osaka University

Recent achievements and future in life science research with TwinMic X-ray spectromicroscope at Elettra
Burkhard Kaulich, Elettra

Application of state of the art full-field transmission x-ray microscopy to nano and bio materials
Piero Pianetta, SSRL Stanford University

Imaging dislocation loops in silicon with a coherent X-ray beam
Vincent Jacques, ESRF